SEM laboratory was established to investigate surface morphologies of metallic and non-metallic materials at high magnification and resolution as well as to determine spatial distribution and the amounts of chemical elements (Be-U) in those materials. In addition to failure analysis, microstructure observation of new products is also the aim of this laboratory.
Tests and Analysis Performed in the Laboratory:
SEM (JEOL JSM-6060):
The surface morphologies and microstructures of the samples are investigated by a Scanning Electron Microscope (SEM) (JEOL-JSM 6060). SEM is used in two different modes: the secondary electron (SE) and the back scattered electron (BE) imaging. The secondary electron (SE) signal is used to generate high-resolution images of surfaces. In the BE mode, high atomic number atoms in the material scatter many electrons. Thus, location and distribution of the heavy and light elements can be observed. Spectrum and depth of the escape of backscattered electrons are directly related to the atomic number of the elements in the samples. Composition of samples and product phases were determined by using the IXRF System Model energy dispersive X-Ray spectrometry (EDS) attached to the SEM. EDS is an analytical technique used for elemental analysis of samples. This is a technique based on the collection and evaluation of the characteristic X-ray energies emitted from the atoms in the sample. Such X-rays are converted into electronic signals by a Si (Li) crystal in the EDS detector attached to the SEM.