Electronic Materials Laboratory

Electronic Materials Laboratory


Determination of electronic properties of electronic materials.

Tests and Analysis Performed in the Laboratory:

  • FTIR (Fourier Transform Infrared Spectroscopy) specimen preparation and investigation,
  • Refractive Index, Band Gap and Film Thickness measurement,
  • Determination of photo catalytic degradation,
  • Determination of dielectric constant and impedance measurement,
  • Determination of transition temperature of superconductive materials,
  • Determination of current-voltage characteristics.


  • Measurement of Superconductivity Transition Temperature
  • FTIR
  • Spectrophotometer
  • Refractometer
  • Multimeter
  • Impedance (dielectric analysis) device
  • Turbidimeter

Measurement of Superconductivity Transition Temperature Device:

It is a device that the measurements of transition temperature (down to 4.1 K) of superconductive materials are employed. This device works in a liquid helium medium. This device consists of cryostat, vacuum pump, linking equipments and electronic parts that is utilized in order to obtain current-voltage characteristics.

Fourier Transform Infrared (FTIR) Spectroscopy:

In order to determine the chemical structure of ceramic and polymeric materials FTIR (Perkin Elmer) is employed. Measurements of liquid, bulk and coatings are held with an ATR apparatus at room temperature between 4000 and 650 cm−1 wave number.


It is used for measurements of band gap of semiconducting films. Absorbance spectra of the films that is deposited on glass substrates were investigated using V-530 JASCO UV/VIS spectrophotometer.


There are two refractometers in the laboratory, one is high precision and the other is low precision. Refractive indexes of the produced films on glass substrates are determined using high precision Abbe type refractometer at room temperature and visible light.

Multimetre :

The device is used in order to determine resistances, capacitive properties, and current-voltage properties.


Dielectric constants, impedances, dielectric losses and resistances versus frequency of the materials are measured using an impedance device.