Aim:
X-ray diffractometer equipment is used to identify the phase structures of both bulk and thin film materials .
Tests and Analysis Performed in the Laboratory:
Equipment:
X-ray Diffractometer:
By using the x-ray diffractometer with a Cu-target x-ray tube in this lab, diffraction patterns which belong to a crystal can be obtained. With this equipment, qualitative phase analysis, crystal structure, cell parameter and crystal system detection analysis and residual stress calculation can be conducted on thin film, bulk and powder materials.